Home > Seminars > The Redefinition of the SI System of Units, and the Single-Electron Ratchet Pump as a Current Standard

The Redefinition of the SI System of Units, and the Single-Electron Ratchet Pump as a Current Standard

Start:

2/26/2019 at 3:00PM

End:

2/26/2019 at 4:00PM

Location:

129 DeBartolo Hall

Host:

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Greg Snider

Greg Snider

VIEW FULL PROFILE Email: gsnider@nd.edu
Phone: 574-631-4148
Website: http://www.nd.edu/~gsnider/
Office: 275 Fitzpatrick Hall

Affiliations

Department of Electrical Engineering Professor and Interim Chair
College of Engineering Professor and Interim Chair
My research in the last few years has focused on the design, fabrication, and measurements of micro and nanoelectronic devices. In the micro regime, my group works on CMOS circuits to study packaging issues, as well as to interface CMOS to nano devices. On the nano side, my research focuses on ...
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The Systeme Internationale d’Unites is being redefined, in an interesting way. This redefinition has fundamental implications for electrical standards, including standards of current based on the charge of the electron.  One mode of semiconducting single-electron pump is the single-gate ratchet mode, based on the concept of a Brownian motor – this fact makes the mode quite subtle in operation.  We show experimentally that, in the same devices, we can demonstrate multiple two-gate pumping modes but not the single-gate mode.  We propose three mechanisms to explain the lack of plateaus in the single-gate ratchet mode.  Educators/textbook writers: I will also discuss a proposal on how to introduce the new SI to students

Seminar Speaker:

Dr. Neil Zimmerman

Dr. Neil Zimmerman

NIST

Neil received a BS from Rensselaer Polytechnic Institute in 1982, and MS and PhD from Cornell University in 1989 (all Physics).  He worked as a postdoc at Bell Laboratories, and since 1994 has worked at NIST, which is the organization that develops and maintains standards for the United States.  His research has mostly been in nano-electronics, including electrical fluctuations due to single-and multi-defect motion, single-electron devices for an electrical current standard and for quantum coherence/quantum computing, the effects of elastic strain and defects on device performance and other topics.  Neil greatly enjoys lively discussion; there will be a cash prize for the first person under the age of 35 who asks a question during his presentation.