Advancing Secure and Resilient Microelectronics: Indiana University’s Strategic Investment in Radiation Effects Mitigation

Jan
26

Advancing Secure and Resilient Microelectronics: Indiana University’s Strategic Investment in Radiation Effects Mitigation

Prof. Daniel Loveless, Indiana University

11:30 a.m.–12:30 p.m., January 26, 2024   |   318 DeBartolo Hall

Indiana University (IU) is dedicating a minimum of $111 million over the next several years to fortify its national leadership in secure, trusted, and resilient microelectronics and nanotechnology. At the forefront of this commitment is the IU Center for Reliable and Trusted Electronics (IU-CREATE), a key initiative driven by a collaborative partnership with NSWC Crane and additional support from the Indiana Economic Development Corp.

IU-CREATE is strategically positioned to cultivate student talent in Indiana and the Ohio River Valley, with a specific focus on high-reliability microelectronics technologies tailored for operation in space and other extreme environments.

This presentation offers a comprehensive overview of IU’s planned research, education, and workforce development initiatives, delving into collaborative opportunities to address the most critical challenges associated with utilizing emerging micro- and nanoelectronics technologies in vital application areas, including artificial intelligence and space environments.

Prof. Daniel Loveless

Prof. Daniel Loveless is an associate professor of intelligent systems engineering at Indiana University. Loveless earned a B.S. degree in electrical engineering from the Georgia Institute of Technology, Atlanta, Georgia, in 2004, and M.S. and Ph.D. degrees in electrical engineering from Vanderbilt University, Nashville, Tennessee, in 2007 and 2009, respectively.

From 2014 to 2023, Prof. Loveless held the position of Guerry Professor of Electrical Engineering at the University of Tennessee at Chattanooga. Before joining UTC in 2014, they served as a senior engineer and research assistant professor at the Institute for Space and Defense Electronics (ISDE) at Vanderbilt University.

Their research interests encompass radiation effects and reliability in electronic and photonic integrated circuits, high-performance and radiation-hardened digital, mixed-signal, and analog integrated circuit design, embedded systems, field-programmable gate arrays (FPGAs), microprocessors and microcontrollers, systems-on-chip, and CubeSat design.

Prof. Loveless boasts a publication record of over 110 articles in peer-reviewed journals, is a senior member of IEEE, and serves as an associate editor of the IEEE Transactions on Nuclear Science. Their accolades include the inaugural 2019 Nuclear and Plasma Sciences Society (NPSS) Radiation Effects Early Achievement Award, five best conference paper awards, and the IEEE NPSS Graduate Scholarship Award, recognizing significant contributions to nuclear and plasma sciences.